Showing results: 1 - 15 of 97 items found.
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SUG-CCITT-A -
Lisun Electronics Inc.
Impulse Test Generator SUG-CCITT-A (1a. 10/700us, 6KV, figure is according to N.1 in IEC60950-1:2005 Annex N). N.1 ITU-T impulse test generators.
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Soken Electric Co. Ltd
mpulse test equipment for testing of low-voltage rotator windings.The equipment is composed of a surge impulse generator circuit, phase selector unit (selection between U, V and W), and waveform recorder circuit to provide a differential method type of impulse testing instrument.
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Fivestar HV Testing Equipment Co., Ltd.
Impulse current test systems are mainly used for testing transmission and distribution systems against the effects of direct or indirect lightning strokes or against electromagnetic interference effects. Primary application of impulse current test systems is the testing of surge arresters, nowadays mainly of the metal-oxide type (MOA) and surge protection devices (SPD). Now they are also widely used to test vehicles, aircrafts, and military applications.
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HTCJ-V / 170 -
Wuhan Huatian Electric Power Automation Co., Ltd.
Used for conducting impulse voltage tests of lightning impulse voltage full wave, lightning impulse voltage truncation wave and operating impulse voltage wave for power equipment, etc., to test insulation performance.
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NEO TELE-TRONIX PVT. LTD
We are renowned as the foremost manufacturer and exporter of High Voltage Impulse Test Set Up. This testing equipment is demanded in electrical, power generation and engineering sector. It is incorporated with fiber optic isolated digitizers to test various types of transformers. We utilize excellent grade raw materials to engineer and develop this High Voltage Impulse Test Set Up in accordance with industry standards. Our clients can get this equipment from us at competitive price.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.